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Comparative evaluation of optical waveguides as alternative interconnections for high-performance packaging / by Schacham, S. E.; Microelectronics Center of North Carolina.Center for Microelectronics.;
Includes bibliographical references (pages 18-20).
Subjects: Optical wave guides; Microelectronics;
Available copies: 1 / Total copies: 2
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A review of the skin effect as applied to thin-film interconnections / by Hwang, Lih-Tyng.(CARDINAL)217092; Turlik, Iwona.(CARDINAL)217093; Microelectronics Center of North Carolina.Center for Microelectronics.;
Includes bibliographical references (pages 31-35).
Subjects: Skin effect (Electricity); Thin-film circuits; Microelectronics;
Available copies: 1 / Total copies: 2
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Feasibility of BCB as an interlevel dielectric in integrated circuits / by Bothra, S.; Garrou, P.; Kellam, M.; Microelectronics Center of North Carolina.Center for Microelectronics.;
Includes bibliographical references.
Subjects: Dielectrics.; Integrated circuits;
Available copies: 1 / Total copies: 2
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The role of surface modification on adhesion at the metal/polymer interface / by Berry, Michael J.(Michael James),1947-(CARDINAL)202029; Microelectronics Center of North Carolina.Center for Microelectronics.;
Includes bibliographical references (leaf [7]).
Subjects: Surfaces (Technology); Polymers; Microelectronics;
Available copies: 1 / Total copies: 2
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Parallel logic simulation of VLSI systems / by Bailey, Mary L.; Briner, Jack V.(Jack Vedder),1961-(CARDINAL)217429; Chamberlain, Roger D.; Microelectronics Center of North Carolina.Center for Microelectronics.;
Includes bibliographical references (pages 32-35).
Subjects: Computer simulation.; Integrated circuits; Logic design.; Parallel processing (Electronic computers);
Available copies: 1 / Total copies: 3
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Calibration issues in piezoresistive strain gauges for stress measurements in electronic packaging / by Sur, Biswajit.; Turlik, Iwona.(CARDINAL)217093; Microelectronics Center of North Carolina.Center for Microelectronics.;
Includes bibliographical references.
Subjects: Integrated circuits; Strain gages;
Available copies: 1 / Total copies: 2
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Ultra-shallow junction formation using silicide as a diffusion source and low thermal budget / by Wang, Q. F.; Osburn, C. M.(CARDINAL)196113; Canovai, C. A.(Christopher A.)(CARDINAL)217090; Microelectronics Center of North Carolina.Center for Microelectronics.;
Includes bibliographical references (pages [14-16]).
Subjects: Integrated circuits; Surfaces (Technology); Microelectronics;
Available copies: 1 / Total copies: 2
On-line resources: Suggest title for digitization;
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